Jason Osborne

Biography

Jason has over 24 years of Scan Probe Microscopy (SPM) expertise, with particular emphasis on fab focused, automated systems. Starting his professional career as a service engineer for semiconductor production line Critical Dimension Atomic Force Microscopes, Jason has held various roles from Tech Support Director through Advanced Technology Development Group Manager, and is now a Principal Engineer for Bruker Nano Surfaces in Goleta. Jason has a B.S. in Physics from Texas A&M University – Kingsville, and did graduate studies in Physics at the University of North Texas. Current development interests are in adapting benchtop SPM materials characterization methods to fully automated techniques for semiconductor wafer fabs.